How Photoinduced Gate Screening and Leakage Currents Dynamically Change the Fermi Level in 2D Materials

著者	Frank Volmer, Manfred Ersfeld, Lars Rathmann, Maximilian Heithoff, Luca Kotewitz, Mark Lohmann, Bowen Yang, Kenji Watanabe, Takashi Taniguchi, Ludwig Bartels, Jing Shi, Christoph Stampfer, Bernd Beschoten.
掲載誌名	physica status solidi (RRL) – Rapid Research Letters 14 [10] 2000298 ISSN: 18626254 ESIでのカテゴリ: PHYSICS
出版社	Wiley
発表年	2020
言語	English
DOI	https://doi.org/10.1002/pssr.202000298
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