HOME > 論文 > 書誌詳細Study of Oxygen Migration at Pt/HfO2/Pt Interface by Bias-application Hard X-ray Photoelectron SpectroscopyNAGATA, Takahiro, YAMASHITA, Yoshiyuki, KOBAYASHI, Keisuke. SPring-8 Research Frontiers 2010 70-71. 2011.NIMS著者長田 貴弘山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:30:24 +0900 更新時刻: 2018-12-14 23:05:33 +0900
