HOME > Article > DetailStudy of Oxygen Migration at Pt/HfO2/Pt Interface by Bias-application Hard X-ray Photoelectron SpectroscopyNAGATA, Takahiro, YAMASHITA, Yoshiyuki, KOBAYASHI, Keisuke. SPring-8 Research Frontiers 2010 70-71. 2011.NIMS author(s)NAGATA, TakahiroYAMASHITA, YoshiyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 16:30:24 +0900 Updated at :2018-12-14 23:05:33 +0900