All about the interface: Do residual contaminants at a high-quality h-BN monolayer perylene diimide interface cause charge trapping?

All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?
(All about the interface: Do residual contaminants at a high-quality h-BN monolayer perylene diimide interface cause charge trapping?)

著者	Lukas Renn, Lisa S. Walter, WATANABE, Kenji, TANIGUCHI, Takashi, R. Thomas Weitz, Lukas Renn, Lisa S. Walter, R. Thomas Weitz.
掲載誌名	Advanced Materials Interfaces 9 [10] 2101701 ISSN: 21967350 ESIでのカテゴリ: MATERIALS SCIENCE
出版社	Wiley
発表年	2022
言語	English
DOI	https://doi.org/10.1002/admi.202101701
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