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All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?
(All about the interface: Do residual contaminants at a high-quality h-BN monolayer perylene diimide interface cause charge trapping?)

Lukas Renn, Lisa S. Walter, Kenji Watanabe, Takashi Taniguchi, R. Thomas Weitz.
Advanced Materials Interfaces 9 [10] 2101701. 2022.
Open Access Wiley (Publisher)

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2022-08-24 03:17:40 +0900Updated at: 2024-07-03 08:37:33 +0900

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