All About the Interface: Do Residual Contaminants at A High‐Quality h‐BN Monolayer Perylene Diimide Interface Cause Charge Trapping?
(All about the interface: Do residual contaminants at a high-quality h-BN monolayer perylene diimide interface cause charge trapping?)
| Author(s) | Lukas Renn, Lisa S. Walter, Kenji Watanabe, Takashi Taniguchi, R. Thomas Weitz. |
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| Journal title | Advanced Materials Interfaces 9 [10] 2101701 ISSN: 21967350 ESI category: MATERIALS SCIENCE |
| Publisher | Wiley |
| Year of publication | 2022 |
| Language | English |
| DOI | https://doi.org/10.1002/admi.202101701 |
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