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Chemical and Electronic Investigation of Buried NiO1−δ, PCBM, and PTAA/MAPbI3–xClx Interfaces Using Hard X-ray Photoelectron Spectroscopy and Transmission Electron Microscopy
(X線光電子分光法と透過電子顕微鏡によるペロブスカイトとNiO、PCBM及びPTAAそれぞれからなる界面の化学的及び電気的視点の研究)

ACS Applied Materials & Interfaces 13 [42] 50481-50490. 2021.
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    Created at: 2021-12-23 15:42:43 +0900Updated at: 2024-07-06 05:01:44 +0900

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