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Chemical and Electronic Investigation of Buried NiO1−δ, PCBM, and PTAA/MAPbI3–xClx Interfaces Using Hard X-ray Photoelectron Spectroscopy and Transmission Electron Microscopy
(Ｘ線光電子分光法と透過電子顕微鏡によるペロブスカイトとNiO、PCBM及びPTAAそれぞれからなる界面の化学的及び電気的視点の研究)

Ibrahima Gueye, Yasuhiro Shirai, Dhruba B. Khadka, Okkyun Seo, Satoshi Hiroi, Masatoshi Yanagida, Kenjiro Miyano, Osami Sakata.
ACS Applied Materials & Interfaces 13 [42] 50481-50490. 2021.
https://doi.org/10.1021/acsami.1c11215

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    Created at: 2021-12-23 15:42:43 +0900Updated at: 2024-04-02 02:36:15 +0900

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