Development of a Simple Probe for Non-Destructive Reversible Electric Contact to nm-Thick Films and 2D Films | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Development of a Simple Probe for Non-Destructive Reversible Electric Contact to nm-Thick Films and 2D Films
(Development of a simple probe for non-destructive reversible electric contact to nm-thick films and 2D films)

Michiko Yoshitake, Shinjiro Yagyu, Toyohiro Chikyow.

e-Journal of Surface Science and Nanotechnology 13 [0] 307-311. 2015.

https://doi.org/10.1380/ejssnt.2015.307

Open Access Surface Science Society Japan (Publisher)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 17:49:42 +0900 更新時刻: 2026-09-28 04:20:22 +0900

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