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Development of a Simple Probe for Non-Destructive Reversible Electric Contact to nm-Thick Films and 2D Films
(Development of a simple probe for non-destructive reversible electric contact to nm-thick films and 2D films)

Open Access Surface Science Society Japan (Publisher)

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2016-05-24 17:49:42 +0900Updated at: 2024-03-29 18:51:10 +0900

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