HOME > Article > DetailDevelopment of a Simple Probe for Non-Destructive Reversible Electric Contact to nm-Thick Films and 2D Films(Development of a simple probe for non-destructive reversible electric contact to nm-thick films and 2D films)Michiko Yoshitake, Shinjiro Yagyu, Toyohiro Chikyow. e-Journal of Surface Science and Nanotechnology 13 [0] 307-311. 2015.https://doi.org/10.1380/ejssnt.2015.307 Open Access Surface Science Society Japan (Publisher) NIMS author(s)YOSHITAKE, MichikoYAGYU, ShinjiroCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:49:42 +0900Updated at: 2024-03-29 18:51:10 +0900