Understanding the Memory Window Overestimation of 2D Materials Based Floating Gate Type Memory Devices by Measuring Floating Gate Voltage

著者	Taro Sasaki, Keiji Ueno, Takashi Taniguchi, Kenji Watanabe, Tomonori Nishimura, Kosuke Nagashio.
掲載誌名	Small 16 [47] 2004907 ISSN: 16136810 ESIでのカテゴリ: MATERIALS SCIENCE
出版社	Wiley
発表年	2020
言語	English
DOI	https://doi.org/10.1002/smll.202004907
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