Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields

G. J. Verbiest; H. Janssen; D. Xu; X. Ge; M. Goldsche; J. Sonntag; T. Khodkov; L. Banszerus; N. von den Driesch; D. Buca; K. Watanabe; T. Taniguchi; C. Stampfer; G. J. Verbiest; H. Janssen; D. Xu; X. Ge; M. Goldsche; J. Sonntag; T. Khodkov; L. Banszerus; N. von den Driesch; D. Buca; K. Watanabe; T. Taniguchi; C. Stampfer

doi:10.1063/1.5089207

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Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields

G. J. Verbiest, H. Janssen, D. Xu, X. Ge, M. Goldsche, J. Sonntag, T. Khodkov, L. Banszerus, N. von den Driesch, D. Buca, K. Watanabe, T. Taniguchi, C. Stampfer.

Review of Scientific Instruments 90 [8] 084706. 2019.

https://doi.org/10.1063/1.5089207

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作成時刻: 2019-09-19 03:00:16 +0900更新時刻: 2025-01-09 05:54:02 +0900