Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields

G. J. Verbiest; H. Janssen; D. Xu; X. Ge; M. Goldsche; J. Sonntag; T. Khodkov; L. Banszerus; N. von den Driesch; D. Buca; K. Watanabe; T. Taniguchi; C. Stampfer; G. J. Verbiest; H. Janssen; D. Xu; X. Ge; M. Goldsche; J. Sonntag; T. Khodkov; L. Banszerus; N. von den Driesch; D. Buca; K. Watanabe; T. Taniguchi; C. Stampfer

doi:10.1063/1.5089207

Integrated impedance bridge for absolute capacitance measurements at cryogenic temperatures and finite magnetic fields

G. J. Verbiest, H. Janssen, D. Xu, X. Ge, M. Goldsche, J. Sonntag, T. Khodkov, L. Banszerus, N. von den Driesch, D. Buca, K. Watanabe, T. Taniguchi, C. Stampfer.

Review of Scientific Instruments 90 [8] 084706. 2019.

https://doi.org/10.1063/1.5089207

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2019-09-19 03:00:16 +0900Updated at: 2024-03-31 02:04:56 +0900