In-Substrate Imaging of Diamond–hBN FET Current via Wide-Field Quantum Diamond Microscopy

Anuj Bathla; Subrat Kumar Pradhan; Ajit Kumar Dash; Prabhat Anand; M. Girish Chandra; Kenji Watanabe; Takashi Taniguchi; Akshay Singh; Veeresh Deshpande; Kasturi Saha; Anuj Bathla; Subrat Kumar Pradhan; Ajit Kumar Dash; Prabhat Anand; M. Girish Chandra; Kenji Watanabe; Takashi Taniguchi; Akshay Singh; Veeresh Deshpande; Kasturi Saha

doi:10.1021/acsaelm.6c00194

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In-Substrate Imaging of Diamond–hBN FET Current via Wide-Field Quantum Diamond Microscopy

Anuj Bathla, Subrat Kumar Pradhan, Ajit Kumar Dash, Prabhat Anand, M. Girish Chandra, Kenji Watanabe, Takashi Taniguchi, Akshay Singh, Veeresh Deshpande, Kasturi Saha.

ACS Applied Electronic Materials 8 [12] 4936-4942. 2026.

https://doi.org/10.1021/acsaelm.6c00194

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作成時刻: 2026-06-30 03:07:19 +0900 更新時刻: 2026-10-03 07:08:49 +0900