SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Atomic layer deposition of Y2O3onh-BN for a gate stack in graphene FETs
(Atomic layer deposition of high-k Y2O3 on h-BN for a gate stack in graphene FETs)

N Takahashi, K Watanabe, T Taniguchi, K Nagashio.
Nanotechnology 26 [17] 175708. 2015.

NIMS著者


Materials Data Repository (MDR)上の本文・データセット


    作成時刻: 2016-05-24 17:46:51 +0900更新時刻: 2024-03-31 18:46:11 +0900

    ▲ページトップへ移動