HOME > 論文 > 書誌詳細Atomic layer deposition of Y2O3onh-BN for a gate stack in graphene FETs(Atomic layer deposition of high-k Y2O3 on h-BN for a gate stack in graphene FETs)N Takahashi, K Watanabe, T Taniguchi, K Nagashio. Nanotechnology 26 [17] 175708. 2015.https://doi.org/10.1088/0957-4484/26/17/175708 NIMS著者渡邊 賢司谷口 尚Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:46:51 +0900更新時刻: 2024-03-31 18:46:11 +0900