HOME > 論文 > 書誌詳細Investigation of dislocations in Nb-doped SrTiO3 by electron-beam-induced current and transmission electron microscopyJun Chen, Takashi Sekiguchi, Jianyong Li, Shun Ito, Wei Yi, Atsushi Ogura. Applied Physics Letters 106 [10] 102109. 2015.https://doi.org/10.1063/1.4915298 NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:47:22 +0900 更新時刻: 2026-10-01 04:19:10 +0900
