SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Investigation of dislocations in Nb-doped SrTiO3 by electron-beam-induced current and transmission electron microscopy

Jun Chen, Takashi Sekiguchi, Jianyong Li, Shun Ito, Wei Yi, Atsushi Ogura.
Applied Physics Letters 106 [10] 102109. 2015.
https://doi.org/10.1063/1.4915298

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2016-05-24 17:47:22 +0900Updated at: 2024-04-01 19:25:17 +0900

    ▲ Go to the top of this page