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著者名Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, Masaki Takeguchi.
タイトルAccurate determination of strains at layered materials by selected area electron diffraction mapping
(Accurate determination of strains at layered materials by selected-area electron diffraction mapping)
掲載誌名Japanese Journal of Applied Physics 58 [SI] SIIA03
ISSN: 00214922
発表年2019
言語English
ESIでのカテゴリ
DOIhttps://doi.org/10.7567/1347-4065/ab19ac
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