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Accurate determination of strains at layered materials by selected area electron diffraction mapping
(Accurate determination of strains at layered materials by selected-area electron diffraction mapping)

Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, Masaki Takeguchi.
Japanese Journal of Applied Physics 58 [SI] SIIA03. 2019.
https://doi.org/10.7567/1347-4065/ab19ac

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    作成時刻: 2019-08-23 03:00:40 +0900 更新時刻: 2026-09-06 04:51:55 +0900

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