HOME > 論文 > 書誌詳細Accurate determination of strains at layered materials by selected area electron diffraction mapping(Accurate determination of strains at layered materials by selected-area electron diffraction mapping)Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, Masaki Takeguchi. Japanese Journal of Applied Physics 58 [SI] SIIA03. 2019.https://doi.org/10.7567/1347-4065/ab19ac NIMS著者三石 和貴大西 剛間野 高明上杉 文彦竹口 雅樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-08-23 03:00:40 +0900更新時刻: 2025-02-16 04:57:45 +0900