HOME > Article > DetailAccurate determination of strains at layered materials by selected area electron diffraction mapping(Accurate determination of strains at layered materials by selected-area electron diffraction mapping)Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Takaaki Mano, Fumihiko Uesugi, Masaki Takeguchi. Japanese Journal of Applied Physics 58 [SI] SIIA03. 2019.https://doi.org/10.7567/1347-4065/ab19ac NIMS author(s)MITSUISHI, KazutakaOHNISHI, TsuyoshiMANO, TakaakiUESUGI, FumihikoTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-08-23 03:00:40 +0900 Updated at :2020-11-16 22:14:47 +0900