Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique
著者 | SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi. |
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掲載誌名 | Beam Injection Based Nanocharacterization of Advanced Materials 139-152 |
出版社 | Beam Injection Based Nanocharacterization of Advanced Materials |
発表年 | 2008 |
言語 | English |