Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique
| 著者 | SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi. |
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| 掲載誌名 | Beam Injection Based Nanocharacterization of Advanced Materials 139-152 |
| 出版社 | Beam Injection Based Nanocharacterization of Advanced Materials |
| 発表年 | 2008 |
| 言語 | English |