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著者名SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi.
タイトルCharacterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique
掲載誌名Beam Injection Based Nanocharacterization of Advanced Materials 139 152
発表年2008
言語English
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