HOME > 論文 > 書誌詳細Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current techniqueSEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi. Beam Injection Based Nanocharacterization of Advanced Materials 139-152. 2008.NIMS著者小泉 聡谷口 尚Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:37:54 +0900更新時刻: 2018-12-15 00:02:58 +0900
