HOME > 論文 > 書誌詳細Analysis of ITO/Mg:GaN interfaces by synchrotron radiation hard x-ray photoemission spectroscopy and their electrical characteriY. Toyoshima, K. Horiba, M. Oshima, J. Ohta, H. Fujioka, H. Miki, S. Ueda, Y. Yamashita, H. Yoshikawa, K. Kobayashi. Applied Surface Science 255 [5] 2149-2152. 2008.https://doi.org/10.1016/j.apsusc.2008.07.050 NIMS著者上田 茂典山下 良之吉川 英樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:33:17 +0900更新時刻: 2024-12-10 04:21:56 +0900
