SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Analysis of ITO/Mg:GaN interfaces by synchrotron radiation hard x-ray photoemission spectroscopy and their electrical characteri

Y. Toyoshima, K. Horiba, M. Oshima, J. Ohta, H. Fujioka, H. Miki, S. Ueda, Y. Yamashita, H. Yoshikawa, K. Kobayashi.
Applied Surface Science 255 [5] 2149-2152. 2008.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at :2016-05-24 15:33:17 +0900 Updated at :2020-11-16 22:55:59 +0900

    ▲ Go to the top of this page