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Analysis of ITO/Mg:GaN interfaces by synchrotron radiation hard x-ray photoemission spectroscopy and their electrical characteri

Y. Toyoshima, K. Horiba, M. Oshima, J. Ohta, H. Fujioka, H. Miki, S. Ueda, Y. Yamashita, H. Yoshikawa, K. Kobayashi.
Applied Surface Science 255 [5] 2149-2152. 2008.
https://doi.org/10.1016/j.apsusc.2008.07.050

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