HOME > 論文 > 書誌詳細Hidden Stacking Fault Charge Traps in Hexagonal Boron Nitride and Their Impact on Dielectric BreakdownTian Lang, Yifeng Liu, Aryan Chugh, Kenji Watanabe, Takashi Taniguchi, Hae Yeon Lee. Nano Letters 26 [9] 3164-3170. 2026.https://doi.org/10.1021/acs.nanolett.5c06347 NIMS著者渡邊 賢司谷口 尚Materials Data Repository (MDR)上の本文・データセット作成時刻: 2026-03-24 03:09:42 +0900 更新時刻: 2026-08-29 06:05:02 +0900
