Hidden Stacking Fault Charge Traps in Hexagonal Boron Nitride and Their Impact on Dielectric Breakdown | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Hidden Stacking Fault Charge Traps in Hexagonal Boron Nitride and Their Impact on Dielectric Breakdown

Tian Lang, Yifeng Liu, Aryan Chugh, Kenji Watanabe, Takashi Taniguchi, Hae Yeon Lee.

Nano Letters 26 [9] 3164-3170. 2026.

https://doi.org/10.1021/acs.nanolett.5c06347

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2026-03-24 03:09:42 +0900 Updated at: 2026-09-30 06:07:55 +0900

▲ Go to the top of this page