SAMURAI - NIMS Researchers Database

HOME > 論文 > 詳細

Valence band edge tail states and band gap defect levels of GaN bulk and In x Ga1− x N films detected by hard X-ray photoemission and photothermal deflection spectroscopy

著者Masatomo Sumiya, Shigenori Ueda, Kiyotaka Fukuda, Yuya Asai, Yujin Cho, Liwen Sang, Akira Uedono, Takashi Sekiguchi, Takeyoshi Onuma, Tohru Honda.
掲載誌名Applied Physics Express 11 [2] 021002
ISSN: 18820786, 18820778, 09538984
ESIでのカテゴリ: PHYSICS
出版社Japan Society of Applied Physics
発表年2018
言語English
DOIhttps://doi.org/10.7567/apex.11.021002
この文献をMendeleyにインポートMendeley

▲ページトップへ移動