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AuthorMasatomo Sumiya, Shigenori Ueda, Kiyotaka Fukuda, Yuya Asai, Yujin Cho, Liwen Sang, Akira Uedono, Takashi Sekiguchi, Takeyoshi Onuma, Tohru Honda.
TitleValence band edge tail states and band gap defect levels of GaN bulk and In x Ga1− x N films detected by hard X-ray photoemission and photothermal deflection spectroscopy
Journal titleApplied Physics Express 11 [2] 021002
ISSN: 18820786 18820778
Year of publication2018
LanguageEnglish
ESI category
DOIhttps://doi.org/10.7567/apex.11.021002
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