Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2

Alessandra Leonhardt; César Javier Lockhart Rosa; Thomas Nuytten; Luca Banszerus; Stefanie Sergeant; Vivek K. Mootheri; Takashi Taniguchi; Kenji Watanabe; Christoph Stampfer; Cedric Huyghebaert; Stefan De Gendt

doi:10.1002/admi.202000413

HOME > 論文 > 書誌詳細

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2
(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)

Alessandra Leonhardt, César Javier Lockhart Rosa, Thomas Nuytten, Luca Banszerus, Stefanie Sergeant, Vivek K. Mootheri, Takashi Taniguchi, Kenji Watanabe, Christoph Stampfer, Cedric Huyghebaert, Stefan De Gendt.

Advanced Materials Interfaces 7 [18] 2000413. 2020.

https://doi.org/10.1002/admi.202000413

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2021-10-08 03:33:36 +0900更新時刻: 2024-03-31 13:34:53 +0900

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2
(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)