Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS
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Alessandra Leonhardt; César Javier Lockhart Rosa; Thomas Nuytten; Luca Banszerus; Stefanie Sergeant; Vivek K. Mootheri; Takashi Taniguchi; Kenji Watanabe; Christoph Stampfer; Cedric Huyghebaert; Stefan De Gendt; Alessandra Leonhardt; César Javier Lockhart Rosa; Thomas Nuytten; Luca Banszerus; Stefanie Sergeant; Vivek K. Mootheri; Takashi Taniguchi; Kenji Watanabe; Christoph Stampfer; Cedric Huyghebaert; Stefan De Gendt

doi:10.1002/admi.202000413

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2
(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)

Alessandra Leonhardt, César Javier Lockhart Rosa, Thomas Nuytten, Luca Banszerus, Stefanie Sergeant, Vivek K. Mootheri, Takashi Taniguchi, Kenji Watanabe, Christoph Stampfer, Cedric Huyghebaert, Stefan De Gendt.

Advanced Materials Interfaces 7 [18] 2000413. 2020.

https://doi.org/10.1002/admi.202000413

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2021-10-08 03:33:36 +0900Updated at: 2024-03-31 13:34:53 +0900

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS 2
(Use of the Indirect Photoluminescence Peak as an Optical Probe of Interface Defectivity in MoS2)