HOME > 論文 > 書誌詳細Detecting band profiles of devices with conductive atomic force microscopyRanran Li, Takashi Taniguchi, Kenji Watanabe, Jiamin Xue. Review of Scientific Instruments 91 [7] 073702. 2020.https://doi.org/10.1063/5.0008412 NIMS著者谷口 尚渡邊 賢司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-07-21 19:42:01 +0900更新時刻: 2024-03-31 00:53:29 +0900
