HOME > Article > DetailDetecting band profiles of devices with conductive atomic force microscopyRanran Li, Takashi Taniguchi, Kenji Watanabe, Jiamin Xue. Review of Scientific Instruments 91 [7] 073702. 2020.https://doi.org/10.1063/5.0008412 NIMS author(s)TANIGUCHI, TakashiWATANABE, KenjiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-07-21 19:42:01 +0900Updated at: 2024-03-31 00:53:29 +0900
