HOME > 論文 > 書誌詳細Reduced defect densities in cubic GaN epilayers with AlGaN/GaN superlattice underlayers grown on (001) GaAs substrates by metaloMutsumi Sugiyama, Taiki Nosaka, Tomonori Suzuki, Takashi Koida, Kiyomi Nakajima, Toyomi Aoyama, Masatomo Sumiya, Toyohiro Chikyow, Akira Uedono, Shigefusa F. Chichibu. Japanese Journal of Applied Physics 43 [3] 958-965. 2004.https://doi.org/10.1143/jjap.43.958 NIMS著者知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 14:41:02 +0900更新時刻: 2024-04-01 23:20:48 +0900
