HOME > Article > DetailElectron-beam-induced current study of small-angle grain boundaries in multicrystalline siliconJ CHEN, T SEKIGUCHI, R XIE, P AHMET, T CHIKYO, D YANG, S ITO, F YIN. Scripta Materialia 52 [12] 1211-1215. 2005.https://doi.org/10.1016/j.scriptamat.2005.03.010 NIMS author(s)CHEN, JunCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:46:20 +0900 Updated at: 2026-11-02 05:28:43 +0900
