HOME > Article > Detail走査型トンネル顕微鏡によるナノ創製とナノ計測の融合:アクティブ・ナノ計測(Fusion of Nanofabrication and Nanocharacterization Using Scanning Tunneling Microscopy: Active Nano-Characterization)藤田 大介, 大西 桂子, 鷺坂 恵介, 大木 泰造. JOURNAL OF SURFACE ANALYSIS 11 [3] 188-195. 2004.NIMS author(s)ONISHI, KeikoSAGISAKA, KeisukeFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 14:36:08 +0900 Updated at: 2018-12-15 00:02:39 +0900