HOME > Article > DetailMultiple-probe scanning probe microscopes for nanoarchitectonic materials scienceTomonobu Nakayama, Yoshitaka Shingaya, Masakazu Aono. Japanese Journal of Applied Physics 55 [11] 1102A7. 2016.https://doi.org/10.7567/jjap.55.1102a7 NIMS author(s)SHINGAYA, YoshitakaAONO, MasakazuFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-12-03 23:07:31 +0900 Updated at: 2026-11-04 04:27:51 +0900
