HOME > 論文 > 書誌詳細Multiple-probe scanning probe microscopes for nanoarchitectonic materials scienceTomonobu Nakayama, Yoshitaka Shingaya, Masakazu Aono. Japanese Journal of Applied Physics 55 [11] 1102A7. 2016.https://doi.org/10.7567/jjap.55.1102a7 NIMS著者中山 知信新ヶ谷 義隆青野 正和Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-12-03 23:07:31 +0900更新時刻: 2024-05-02 08:28:40 +0900