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Wafer-scale analysis of GaN substrate wafer by imaging cathodoluminescence

Wei Yi, Jun Chen, Seiji Higuchi, Takashi Sekiguchi.
Applied Physics Express 12 [5] 051005. 2019.
Open Access Japan Society of Applied Physics (Publisher)

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    作成時刻 :2019-08-08 03:11:56 +0900 更新時刻 :2020-11-16 22:14:33 +0900

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