HOME > Article > DetailWafer-scale analysis of GaN substrate wafer by imaging cathodoluminescenceWei Yi, Jun Chen, Seiji Higuchi, Takashi Sekiguchi. Applied Physics Express 12 [5] 051005. 2019.https://doi.org/10.7567/1882-0786/ab0db8 Open Access Japan Society of Applied Physics (Publisher) NIMS author(s)YI, WeiCHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-08-08 03:11:56 +0900Updated at: 2024-03-31 00:39:04 +0900
