HOME > 論文 > 書誌詳細Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric filmChul-Min Choi, Young-Taek Oh, Kyung-Jun Kim, Jin-Suk Park, Hiroaki Sukegawa, Seiji Mitani, Sung-Kyu Kim, Jeong-Yong Lee, Yun-Heub Song. Semiconductor Science and Technology 31 [7] 075004. 2016.https://doi.org/10.1088/0268-1242/31/7/075004 NIMS著者介川 裕章三谷 誠司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-12-14 00:00:29 +0900更新時刻: 2024-10-07 04:31:06 +0900
