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Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric film

Chul-Min Choi, Young-Taek Oh, Kyung-Jun Kim, Jin-Suk Park, Hiroaki Sukegawa, Seiji Mitani, Sung-Kyu Kim, Jeong-Yong Lee, Yun-Heub Song.
Semiconductor Science and Technology 31 [7] 075004. 2016.
https://doi.org/10.1088/0268-1242/31/7/075004

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