HOME > 論文 > 書誌詳細Even–Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator DevicesBo Chen, Xiaoda Liu, Yuhang Li, Han Tay, Takashi Taniguchi, Kenji Watanabe, Moses H. W. Chan, Jiaqiang Yan, Fengqi Song, Ran Cheng, Cui-Zu Chang. Nano Letters 24 [27] 8320-8326. 2024.https://doi.org/10.1021/acs.nanolett.4c01597 NIMS著者谷口 尚渡邊 賢司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2025-02-23 03:08:37 +0900 更新時刻: 2026-08-10 04:33:50 +0900
