HOME > Article > DetailEven–Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator DevicesBo Chen, Xiaoda Liu, Yuhang Li, Han Tay, Takashi Taniguchi, Kenji Watanabe, Moses H. W. Chan, Jiaqiang Yan, Fengqi Song, Ran Cheng, Cui-Zu Chang. Nano Letters 24 [27] 8320-8326. 2024.https://doi.org/10.1021/acs.nanolett.4c01597 NIMS author(s)TANIGUCHI, TakashiWATANABE, KenjiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2025-02-23 03:08:37 +0900 Updated at: 2026-10-12 04:34:00 +0900
