Investigation on the interfacial chemical state and band alignment for the sputtering-deposited CaF2/p-GaN heterojunction by angle-resolved X-ray photoelectron spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Investigation on the interfacial chemical state and band alignment for the sputtering-deposited CaF2/p-GaN heterojunction by angle-resolved X-ray photoelectron spectroscopy

Kexiong Zhang, Meiyong Liao, Masatomo Sumiya, Yasuo Koide, Liwen Sang.

Journal of Applied Physics 120 [18] 185305. 2016.

https://doi.org/10.1063/1.4967394

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-11-20 22:19:22 +0900更新時刻: 2024-04-01 17:34:41 +0900

▲ページトップへ移動