HOME > 論文 > 書誌詳細Chemical Controllability of Charge States of Nitrogen-related Defects in HfOxNy: First-principles calculationsN. Umezawa, K. Shiraishi, Y. Akasaka, A. Oshiyama, S. Inumiya, S. Miyazaki, K. Ohmori, T. Chikyow, T. Ohno, K. Yamabe, Y. Nara, K. Yamada. Physical Review B 77 [16] 165130. 2008.https://doi.org/10.1103/physrevb.77.165130 NIMS著者知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:29:23 +0900更新時刻: 2024-04-02 00:34:21 +0900
