Chemical Controllability of Charge States of Nitrogen-related Defects in HfOxNy: First-principles calculations

N. Umezawa, K. Shiraishi, Y. Akasaka, A. Oshiyama, S. Inumiya, S. Miyazaki, K. Ohmori, T. Chikyow, T. Ohno, K. Yamabe, Y. Nara, K. Yamada.

Physical Review B 77 [16] 165130. 2008.

Created at: 2016-05-24 15:29:23 +0900Updated at: 2024-04-02 00:34:21 +0900