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Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs

Yu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono.
IEEE Electron Device Letters 42 [9] 1319-1322. 2021.

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    作成時刻 :2021-09-07 03:00:17 +0900 更新時刻 :2021-09-28 22:43:10 +0900

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