HOME > Article > DetailUnintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTsYu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono. IEEE Electron Device Letters 42 [9] 1319-1322. 2021.https://doi.org/10.1109/led.2021.3101654 NIMS author(s)UEDA, ShigenoriHOSONO, HideoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-09-07 03:00:17 +0900Updated at: 2024-04-02 03:38:19 +0900
