Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs
著者 | Yu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono. |
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掲載誌名 | IEEE Electron Device Letters 42 [9] 1319-1322 ISSN: 07413106, 15580563 ESIでのカテゴリ: ENGINEERING |
出版社 | Institute of Electrical and Electronics Engineers (IEEE) |
発表年 | 2021 |
言語 | English |
DOI | https://doi.org/10.1109/led.2021.3101654 |
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