HOME > 論文 > 書誌詳細Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTsYu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono. IEEE Electron Device Letters 42 [9] 1319-1322. 2021.https://doi.org/10.1109/led.2021.3101654 NIMS著者上田 茂典細野 秀雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-09-07 03:00:17 +0900更新時刻: 2025-02-17 05:38:36 +0900
