Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs

著者	Yu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono.
掲載誌名	IEEE Electron Device Letters 42 [9] 1319-1322 ISSN: 07413106, 15580563 ESIでのカテゴリ: ENGINEERING
出版社	Institute of Electrical and Electronics Engineers (IEEE)
発表年	2021
言語	English
DOI	https://doi.org/10.1109/led.2021.3101654
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