SAMURAI - NIMS Researchers Database

HOME > 論文 > 書誌詳細

Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs

Yu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono.
IEEE Electron Device Letters 42 [9] 1319-1322. 2021.

NIMS著者


Materials Data Repository (MDR)上の本文・データセット


    作成時刻: 2021-09-07 03:00:17 +0900更新時刻: 2024-06-04 08:07:04 +0900

    ▲ページトップへ移動