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Unintended Carbon-Related Impurity and Negative Bias Instability in High-Mobility Oxide TFTs

著者Yu-Shien Shiah, Kihyung Sim, Shigenori Ueda, Junghwan Kim, Hideo Hosono.
掲載誌名IEEE Electron Device Letters 42 [9] 1319-1322
ISSN: 07413106, 15580563
ESIでのカテゴリ: ENGINEERING
出版社Institute of Electrical and Electronics Engineers (IEEE)
発表年2021
言語English
DOIhttps://doi.org/10.1109/led.2021.3101654
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