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Deep-level defects related to the emissive pits in thick InGaN films on GaN template and bulk substrates

著者Masatomo Sumiya, Naoki Toyomitsu, Yoshitaka Nakano, Jianyu Wang, Yoshitomo Harada, Liwen Sang, Takashi Sekiguchi, Tomohiro Yamaguchi, Tohru Honda.
掲載誌名APL Materials 5 [1] 016105
ISSN: 2166532X
ESIでのカテゴリ: MATERIALS SCIENCE
出版社AIP Publishing
発表年2017
言語English
DOIhttps://doi.org/10.1063/1.4974935
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