HOME > 論文 > 書誌詳細Deep-level defects related to the emissive pits in thick InGaN films on GaN template and bulk substratesMasatomo Sumiya, Naoki Toyomitsu, Yoshitaka Nakano, Jianyu Wang, Yoshitomo Harada, Liwen Sang, Takashi Sekiguchi, Tomohiro Yamaguchi, Tohru Honda. APL Materials 5 [1] 016105. 2017.https://doi.org/10.1063/1.4974935 Open Access AIP Publishing (Publisher) NIMS著者角谷 正友サン リウエンMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2018-01-20 20:53:40 +0900更新時刻: 2024-03-30 02:11:35 +0900
