HOME > Article > DetailDeep-level defects related to the emissive pits in thick InGaN films on GaN template and bulk substratesMasatomo Sumiya, Naoki Toyomitsu, Yoshitaka Nakano, Jianyu Wang, Yoshitomo Harada, Liwen Sang, Takashi Sekiguchi, Tomohiro Yamaguchi, Tohru Honda. APL Materials 5 [1] 016105. 2017.https://doi.org/10.1063/1.4974935 Open Access AIP Publishing (Publisher) NIMS author(s)SUMIYA, MasatomoSANG, LiwenFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2018-01-20 20:53:40 +0900 Updated at :2020-11-16 22:58:00 +0900