HOME > 論文 > 書誌詳細Evaluation of minority-carrier diffusion length in n-type beta-FeSi2 single crystals by electron-beam-induced currentTeruhisa Ootsuka, Takashi Suemasu, Jun Chen, Takashi Sekiguchi. Applied Physics Letters 92 [4] 042117. 2008.https://doi.org/10.1063/1.2835904 NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:29:59 +0900更新時刻: 2024-04-01 18:20:08 +0900
