HOME > 論文 > 書誌詳細Thickness dependence of phase stability in epitaxial (HfxZr1−x)O2 filmsTakanori Mimura, Takao Shimizu, Osami Sakata, Hiroshi Funakubo. Physical Review Materials 5 [11] 114407. 2021.https://doi.org/10.1103/physrevmaterials.5.114407 NIMS著者清水 荘雄Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-12-15 03:37:24 +0900更新時刻: 2024-09-12 06:58:51 +0900