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Thickness dependence of phase stability in epitaxial (HfxZr1−x)O2 films

Takanori Mimura, Takao Shimizu, Osami Sakata, Hiroshi Funakubo.
Physical Review Materials 5 [11] 114407. 2021.

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    Created at: 2021-12-15 03:37:24 +0900Updated at: 2024-05-03 09:40:45 +0900

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