HOME > Article > DetailThickness dependence of phase stability in epitaxial (HfxZr1−x)O2 filmsTakanori Mimura, Takao Shimizu, Osami Sakata, Hiroshi Funakubo. Physical Review Materials 5 [11] 114407. 2021.https://doi.org/10.1103/physrevmaterials.5.114407 NIMS author(s)SHIMIZU, TakaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-12-15 03:37:24 +0900Updated at: 2024-04-02 05:04:59 +0900
